The performance of solid oxide cells (SOCs) is highly dependent on triple phase boundaries (TPBs). Therefore, detailed TPB characterization is crucial for their further development. We demonstrate that it is possible to prepare a similar to 50 nm thick transmission electron microscopy (TEM) lamella of the interface between the dense ceramic electrolyte and the porous metallic/ceramic hydrogen electrode of an SOC using focused ion beam milling. We show combined TEM/scanning TEM/energy-dispersive spectroscopy investigations of the nanostructure at the TPBs in a high-performance SOC. The chemical composition of nanoscale impurity phases at the TPBs has been obtained with a few nanometers lateral resolution. (c) 2008 The Electrochemical Society.
|Journal||Electrochemical and Solid-State Letters|
|Publication status||Published - 2008|