Nanoscale chemical analysis and imaging of solid oxide cells

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    Abstract

    The performance of solid oxide cells (SOCs) is highly dependent on triple phase boundaries (TPBs). Therefore, detailed TPB characterization is crucial for their further development. We demonstrate that it is possible to prepare a similar to 50 nm thick transmission electron microscopy (TEM) lamella of the interface between the dense ceramic electrolyte and the porous metallic/ceramic hydrogen electrode of an SOC using focused ion beam milling. We show combined TEM/scanning TEM/energy-dispersive spectroscopy investigations of the nanostructure at the TPBs in a high-performance SOC. The chemical composition of nanoscale impurity phases at the TPBs has been obtained with a few nanometers lateral resolution. (c) 2008 The Electrochemical Society.
    Original languageEnglish
    JournalElectrochemical and Solid-State Letters
    Volume11
    Issue number3
    Pages (from-to)B38-B41
    ISSN1099-0062
    DOIs
    Publication statusPublished - 2008

    Bibliographical note

    Copyright The Electrochemical Society, Inc. [2008]. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS).

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