Nanoscale Characterisation of Thin Film Adhesion Layers

Mario Frederik Heinig, Matteo Todeschini, Johneph Sukham, Radu Malureanu, Alice Bastos da Silva Fanta, Henri Jansen, Jakob Birkedal Wagner, Shima Kadkhodazadeh

Research output: Contribution to conferencePosterResearchpeer-review

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Original languageEnglish
Publication date2018
Publication statusPublished - 2018
Event69th Annual Conference of the Nordic Microscopy Society - Technical University of Denmark, Kgs. Lyngby, Denmark
Duration: 25 Jun 201828 Jun 2018
Conference number: 69


Conference69th Annual Conference of the Nordic Microscopy Society
LocationTechnical University of Denmark
CityKgs. Lyngby
Internet address

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