Nanometric in-plane displacement measurement using phase singularities in the Riesz-transform analytic signals of speckle patterns (in Japanese)

T. Yokozeki; W. Wang; R. Ishijima; A. Wada; Steen Grüner Hanson; Y. Miyamoto; M. Takeda

Nanometric in-plane displacement measurement using phase singularities in the Riesz-transform analytic signals of speckle patterns (in Japanese)

T. Yokozeki, W. Wang, R. Ishijima, A. Wada, Steen Grüner Hanson, Y. Miyamoto, M. Takeda

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Optics Japan 2005
Place of Publication	Tokyo
Publisher	Optical Society of Japan
Publication date	2005
Pages	702-703
Publication status	Published - 2005
Event	Optics Japan 2005 - Tokyo, Japan Duration: 23 Nov 2005 → 25 Nov 2005

Conference

Conference	Optics Japan 2005
Country/Territory	Japan
City	Tokyo
Period	23/11/2005 → 25/11/2005

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@inproceedings{544ef6096294489980fb1cab1e09c24a,

title = "Nanometric in-plane displacement measurement using phase singularities in the Riesz-transform analytic signals of speckle patterns (in Japanese)",

keywords = "6-I optik",

author = "T. Yokozeki and W. Wang and R. Ishijima and A. Wada and Hanson, {Steen Gr{\"u}ner} and Y. Miyamoto and M. Takeda",

year = "2005",

language = "English",

pages = "702--703",

booktitle = "Optics Japan 2005",

publisher = "Optical Society of Japan",

note = "Optics Japan 2005 ; Conference date: 23-11-2005 Through 25-11-2005",

}

TY - GEN

T1 - Nanometric in-plane displacement measurement using phase singularities in the Riesz-transform analytic signals of speckle patterns (in Japanese)

AU - Yokozeki, T.

AU - Wang, W.

AU - Ishijima, R.

AU - Wada, A.

AU - Hanson, Steen Grüner

AU - Miyamoto, Y.

AU - Takeda, M.

PY - 2005

Y1 - 2005

KW - 6-I optik

M3 - Article in proceedings

SP - 702

EP - 703

BT - Optics Japan 2005

PB - Optical Society of Japan

CY - Tokyo

T2 - Optics Japan 2005

Y2 - 23 November 2005 through 25 November 2005

ER -