Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern

W. Wang, T. Yokozeki, R. Ishijima, Steen Grüner Hanson, M. Takeda

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationInterferometry 13: Techniques and analysis
    Place of PublicationBellingham
    PublisherInternational Society for Optical Engineering
    Publication date2006
    Publication statusPublished - 2006
    EventSPIE Optics + Photonics 2006 - San Diego, United States
    Duration: 13 Aug 200617 Aug 2006

    Conference

    ConferenceSPIE Optics + Photonics 2006
    Country/TerritoryUnited States
    CitySan Diego
    Period13/08/200617/08/2006
    SeriesSPIE Proceedings Series, 6292

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