Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern

W. Wang, T. Yokozeki, R. Ishijima, Steen Grüner Hanson, M. Takeda

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationInterferometry 13: Techniques and analysis
    Place of PublicationBellingham
    PublisherInternational Society for Optical Engineering
    Publication date2006
    Publication statusPublished - 2006
    EventSPIE conference on optics and photonics 2006. Conference 6292 - San Diego, CA (US), 14-16 Aug
    Duration: 1 Jan 2006 → …

    Conference

    ConferenceSPIE conference on optics and photonics 2006. Conference 6292
    CitySan Diego, CA (US), 14-16 Aug
    Period01/01/2006 → …
    SeriesSPIE Proceedings Series, 6292

    Cite this

    Wang, W., Yokozeki, T., Ishijima, R., Hanson, S. G., & Takeda, M. (2006). Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern. In Interferometry 13: Techniques and analysis International Society for Optical Engineering. SPIE Proceedings Series, 6292