Nanomechanical IR Spectroscopy for the fast analysis of picogram samples of engineered nanomaterials

Alina Joukainen Andersen, Pramod Kumar Ek, Thomas Lars Andresen, Shoko Yamada, Anja Boisen, Silvan Schmid

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    Abstract

    The proliferation of engineered nanomaterials (ENMs), e.g. in nanomedicine, demands for novel sensitive techniques allowing for the analysis of minute samples. We present nanoelectromechanical system-based IR spectroscopy (NEMS-IR) of picograms of polymeric micelles. The micelles are nebulized with electrospray directly from dispersion and then efficiently collected on the sensor, which detects the IR-wavelength-dependent photothermal sample heating. Only 10 nL of sample (~0.1 mg/mL) is required for the acquisition of an IR spectrum. Measurement, including sample preparation, takes only a few minutes, compared to 2 days for analysis by ATR-FT-IR. NEMS-IR constitutes a promising technique for the fast analysis of ENMs.
    Original languageEnglish
    Title of host publicationProceedings of the 18th International Conference on Miniaturized Systems for Chemistry and Life Sciences
    Number of pages2
    Publication date2014
    Pages2552-2553
    Publication statusPublished - 2014
    Event18th International Conference on Miniaturized Systems for Chemistry and Life Sciences - San Antonio, United States
    Duration: 26 Oct 201430 Oct 2014
    Conference number: 18
    https://microtasconferences.org/microtas2014/

    Conference

    Conference18th International Conference on Miniaturized Systems for Chemistry and Life Sciences
    Number18
    Country/TerritoryUnited States
    CitySan Antonio
    Period26/10/201430/10/2014
    Internet address

    Keywords

    • NEMS-IR
    • Engineered nanoparticles
    • Nanomedicine
    • Infrared spectroscopy

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