Nanomanipulation of 2 inch wafer fabrication of vertically aligned carbon nanotube arrays by nanoimprint lithography

Ian Y. Y. Bu, Volkmar Eichhorn, Kenneth Carlson, Peter Bøggild, Sergej Fatikow

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Carbon nanotube (CNT) arrays are typically defined by electron beam lithography (EBL), and hence limited to small areas due to the low throughput. To obtain wafer‐scale fabrication we propose large area thermal nanoimprint lithography (NIL). A 2‐inch stamp master is defined using EBL for subsequent pattern transfer to a hard metal mask before deep reactive ion etching (RIE) to form the stamp protrusions. This stamp master is then pressed against a wafer covered with nanoimprint resist, at a temperature above the glass transition temperature, transferring the pattern to polymer. Using this process, efficient production of wafer‐scale/larger arrays of CNTs has been achieved. The CNTs have been deposited by wafer‐scale plasma enhanced chemical vapour deposition (PECVD) of C2H2/NH3. Substrates containing such nanotubes have been used to automate nanorobotic manipulation sequences of individual CNTs and their assembly into prototypic CNT‐based devices.
    Original languageEnglish
    JournalPhysica Status Solidi. A: Applications and Materials Science (Print)
    Volume208
    Issue number10
    Pages (from-to)2352-2356
    ISSN1862-6300
    DOIs
    Publication statusPublished - 2011

    Keywords

    • Carbon nanotubes
    • Nanomanipulation
    • Nanoimprint lithography
    • Wafer scale

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