Nanochemical surface analyzer in CMOS technology

W. Franks, D. Lange, Seunghwan Lee, A. Hierlemann, N. D. Spencer, H. Baltes

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalUltramicroscopy
Volume91
Issue number1-4
Pages (from-to)21-27
ISSN0304-3991
Publication statusPublished - 2002
Externally publishedYes

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