We present a multi-scale study of recrystallization annealing of an 85% cold rolled Fe-3%Si-0.1%Sn alloy using a combination of dark field X-ray microscopy (DFXM), synchrotron X-ray diffraction (SXRD), and electron backscatter diffraction (EBSD). Grains of interest from high stored energy (HSE) regions in a 200 mu m-thick sample are studied using DFXM during isothermal annealing. The intra-granular structure of the as deformed grain reveals deformation bands separated by approximate to 3-5 degrees misorientation. Geometrically Necessary Dislocation evolution during recrystallization and growth is investigated. These findings are supported by a quantitative non-destructive texture analysis using SXRD in terms of pole figures and orientation distribution functions. Although no significant macroscopic texture change is observed up to 50% recrystallization, the calculated texture index indicates different nucleation and growth processes at various stages of annealing. Our results show that zones of local misorientation in the HSE regions are decisive for the formation and growth of recrystallized grains.
|Journal||IOP Conference Series-Materials Science and Engineering|
|Number of pages||7|
|Publication status||Published - 2022|
|Event||42nd Risø International Symposium on Materials Science - Risø, Denmark|
Duration: 5 Sep 2022 → 9 Sep 2022
|Conference||42nd Risø International Symposium on Materials Science|
|Period||05/09/2022 → 09/09/2022|