Multilayer Laue lenses at high X-ray energies: performance and applications

Kevin T. Murray, Anders Filsøe Pedersen, Istvan Mohacsi, Carsten Detlefs, Andrew J. Morgan, Mauro Prasciolu, Can Yildirim, Hugh Simons, Anders Clemen Jakobsen, Henry N. Chapman, Henning Friis Poulsen, Saša Bajt*

*Corresponding author for this work

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X-ray microscopy at photon energies above 15 keV is very attractive for the investigation of atomic and nanoscale properties of technologically relevant structural and bio materials. This method is limited by the quality of X-ray optics. Multilayer Laue lenses (MLLs) have the potential to make a major impact in this field because, as compared to other X-ray optics, they become more efficient and effective with increasing photon energy. In this work, MLLs were utilized with hard X-rays at photon energies up to 34.5 keV. The design, fabrication, and performance of these lenses are presented, and their application in several imaging configurations is described. In particular, two “full field” modes of imaging were explored, which provide various contrast modalities that are useful for materials characterisation. These include point projection imaging (or Gabor holography) for phase contrast imaging and direct imaging with both bright-field and dark-field illumination. With high-efficiency MLLs, such modes offer rapid data collection as compared with scanning methods as well as a large field of views.

Original languageEnglish
JournalOptics Express
Issue number5
Pages (from-to)7120-7138
Publication statusPublished - 2019

Cite this

Murray, K. T., Pedersen, A. F., Mohacsi, I., Detlefs, C., Morgan, A. J., Prasciolu, M., Yildirim, C., Simons, H., Jakobsen, A. C., Chapman, H. N., Poulsen, H. F., & Bajt, S. (2019). Multilayer Laue lenses at high X-ray energies: performance and applications. Optics Express, 27(5), 7120-7138.