Multi-scale 3D characterization with dark-field x-ray microscopy

Hugh William Simons*, Anders Clemen Jakobsen, Sonja Rosenlund Ahl, Phil K. Cook, Carsten Detlefs, Henning Friis Poulsen

*Corresponding author for this work

Research output: Contribution to journalConference abstract in journalResearchpeer-review

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Original languageEnglish
Article numberMS067.O01
JournalActa Crystallographica. Section A: Foundations of Crystallography
Volume73
Pages (from-to)C852-C852
Number of pages1
ISSN0108-7673
DOIs
Publication statusPublished - 2017
Event24th Congress and General Assembly of the International Union of Crystallography - Hyderabad, India
Duration: 21 Aug 201728 Aug 2017

Conference

Conference24th Congress and General Assembly of the International Union of Crystallography
CountryIndia
CityHyderabad
Period21/08/201728/08/2017

Keywords

  • Diffraction
  • Microscopy
  • Ferroelectrics

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