Multi-scale 3D characterization with dark-field x-ray microscopy

Hugh William Simons; Anders Clemen Jakobsen; Sonja Rosenlund Ahl; Phil K. Cook; Carsten Detlefs; Henning Friis Poulsen

doi:10.1107/S2053273317087228

Multi-scale 3D characterization with dark-field x-ray microscopy

Hugh William Simons^*, Anders Clemen Jakobsen, Sonja Rosenlund Ahl, Phil K. Cook, Carsten Detlefs, Henning Friis Poulsen

^*Corresponding author for this work

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

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Original language	English
Article number	MS067.O01
Journal	Acta Crystallographica. Section A: Foundations of Crystallography
Volume	73
Pages (from-to)	C852-C852
Number of pages	1
ISSN	0108-7673
DOIs	https://doi.org/10.1107/S2053273317087228
Publication status	Published - 2017
Event	24th Congress and General Assembly of the International Union of Crystallography - Hyderabad, India Duration: 21 Aug 2017 → 28 Aug 2017

Conference

Conference	24th Congress and General Assembly of the International Union of Crystallography
Country	India
City	Hyderabad
Period	21/08/2017 → 28/08/2017

Keywords

Diffraction
Microscopy
Ferroelectrics

Access to Document

10.1107/S2053273317087228

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Cite this

@article{887b3b90930e4ab58f889cd44c41f264,

title = "Multi-scale 3D characterization with dark-field x-ray microscopy",

keywords = "Diffraction, Microscopy, Ferroelectrics",

author = "Simons, {Hugh William} and Jakobsen, {Anders Clemen} and Ahl, {Sonja Rosenlund} and Cook, {Phil K.} and Carsten Detlefs and Poulsen, {Henning Friis}",

year = "2017",

doi = "10.1107/S2053273317087228",

language = "English",

volume = "73",

pages = "C852--C852",

journal = "Acta Crystallographica. Section A: Foundations of Crystallography",

issn = "0108-7673",

publisher = "Wiley-Blackwell",

note = "24th Congress and General Assembly of the International Union of Crystallography, XXIV IUCr Congress ; Conference date: 21-08-2017 Through 28-08-2017",

}

Multi-scale 3D characterization with dark-field x-ray microscopy. / Simons, Hugh William; Jakobsen, Anders Clemen; Ahl, Sonja Rosenlund; Cook, Phil K.; Detlefs, Carsten; Poulsen, Henning Friis.

In: Acta Crystallographica. Section A: Foundations of Crystallography, Vol. 73, MS067.O01, 2017, p. C852-C852.

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

TY - ABST

T1 - Multi-scale 3D characterization with dark-field x-ray microscopy

AU - Simons, Hugh William

AU - Jakobsen, Anders Clemen

AU - Ahl, Sonja Rosenlund

AU - Cook, Phil K.

AU - Detlefs, Carsten

AU - Poulsen, Henning Friis

PY - 2017

Y1 - 2017

KW - Diffraction

KW - Microscopy

KW - Ferroelectrics

U2 - 10.1107/S2053273317087228

DO - 10.1107/S2053273317087228

M3 - Conference abstract in journal

VL - 73

SP - C852-C852

JO - Acta Crystallographica. Section A: Foundations of Crystallography

JF - Acta Crystallographica. Section A: Foundations of Crystallography

SN - 0108-7673

M1 - MS067.O01

T2 - 24th Congress and General Assembly of the International Union of Crystallography

Y2 - 21 August 2017 through 28 August 2017

ER -