Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers

SS Perry; TR Lee; Seunghwan Lee; M Graupe; A Puck; R Colorado Jr; I Wenzl

Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers

SS Perry, TR Lee, Seunghwan Lee, M Graupe, A Puck, R Colorado Jr, I Wenzl

University of Houston

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review

Original language	English
Title of host publication	Abstracts of papers of the American Chemical Society
Volume	220
Publication date	2000
Publication status	Published - 2000
Externally published	Yes
Event	218th National Meeting of the American Chemical Society - New Orleans, United States Duration: 22 Aug 1999 → 26 Aug 1999

Conference

Conference	218th National Meeting of the American Chemical Society
Country/Territory	United States
City	New Orleans
Period	22/08/1999 → 26/08/1999

OpenUrl availability

Full text

Cite this

@inbook{a01ed4f1d5604483ab690bb5ae3007af,

title = "Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers",

author = "SS Perry and TR Lee and Seunghwan Lee and M Graupe and A Puck and {Colorado Jr}, R and I Wenzl",

year = "2000",

language = "English",

volume = "220",

booktitle = "Abstracts of papers of the American Chemical Society",

note = "218th National Meeting of the American Chemical Society ; Conference date: 22-08-1999 Through 26-08-1999",

}

Perry, SS, Lee, TR, Lee, S, Graupe, M, Puck, A, Colorado Jr, R & Wenzl, I 2000, Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers. in Abstracts of papers of the American Chemical Society. vol. 220, 218th National Meeting of the American Chemical Society, New Orleans, Louisiana, United States, 22/08/1999.

Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers. / Perry, SS; Lee, TR; Lee, Seunghwan et al.
Abstracts of papers of the American Chemical Society. Vol. 220 2000.

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review

TY - ABST

T1 - Molecular level interpretations of friction force data collected with atomic force microscopy: Chain length effects in self assembled organic monolayers

AU - Perry, SS

AU - Lee, TR

AU - Lee, Seunghwan

AU - Graupe, M

AU - Puck, A

AU - Colorado Jr, R

AU - Wenzl, I

PY - 2000

Y1 - 2000

M3 - Conference abstract in proceedings

VL - 220

BT - Abstracts of papers of the American Chemical Society

T2 - 218th National Meeting of the American Chemical Society

Y2 - 22 August 1999 through 26 August 1999

ER -