Modelling Q-factors of micro pillars

Torben Roland Nielsen (Invited author), Niels Gregersen (Invited author), Bjarne Tromborg (Invited author), Jesper Mørk (Invited author)

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

240 Downloads (Pure)


The influence of fabrication induced imperfections on quality factors for a microcavity pillar is studied numerically. The dependence on side-wall inclination and etch variations is quantified.
Original languageEnglish
Title of host publication9th International Conference on Transparent Optical Networks, 2007. ICTON '07.
Publication date2007
ISBN (Print)1-4244-1249-8
Publication statusPublished - 2007
Event9th International Conference on Transparent Optical Networks - Rome, Italy
Duration: 1 Jul 20075 Jul 2007
Conference number: 9


Conference9th International Conference on Transparent Optical Networks
Internet address

Bibliographical note

Copyright: 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE


Dive into the research topics of 'Modelling Q-factors of micro pillars'. Together they form a unique fingerprint.

Cite this