Abstract
The influence of fabrication induced imperfections on quality factors for a microcavity pillar is studied numerically. The dependence on side-wall inclination and etch variations is quantified.
Original language | English |
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Title of host publication | 9th International Conference on Transparent Optical Networks, 2007. ICTON '07. |
Publisher | IEEE |
Publication date | 2007 |
ISBN (Print) | 1-4244-1249-8 |
DOIs | |
Publication status | Published - 2007 |
Event | 9th International Conference on Transparent Optical Networks - Rome, Italy Duration: 1 Jul 2007 → 5 Jul 2007 Conference number: 9 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4294280 |
Conference
Conference | 9th International Conference on Transparent Optical Networks |
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Number | 9 |
Country/Territory | Italy |
City | Rome |
Period | 01/07/2007 → 05/07/2007 |
Internet address |