Modelling CMOS radiation tolerance in the high-dose range

A. Holmes-Siedle, P. Christensen, L. Adams, C.-C. Seifert

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	RADECS'95
Editors	G. Sarrabayrouse, M. Labrunee, R. Ecoffet
Place of Publication	Piscataway, NJ
Publisher	IEEE
Publication date	1997
Pages	183-190
ISBN (Print)	0-7803-3093-5
Publication status	Published - 1997
Event	3. European conference on radiation and its effects on components and systems - Arcachon (FR), 18-22 Sep Duration: 1 Jan 1995 → …

Conference	3. European conference on radiation and its effects on components and systems
City	Arcachon (FR), 18-22 Sep
Period	01/01/1995 → …

OpenUrl availability

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author = "A. Holmes-Siedle and P. Christensen and L. Adams and C.-C. Seifert",

year = "1997",

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TY - GEN

T1 - Modelling CMOS radiation tolerance in the high-dose range

AU - Holmes-Siedle, A.

AU - Christensen, P.

AU - Adams, L.

AU - Seifert, C.-C.

PY - 1997

Y1 - 1997

KW - Systemanalyse

M3 - Article in proceedings

SN - 0-7803-3093-5

SP - 183

EP - 190

BT - RADECS'95

A2 - Sarrabayrouse, G.

A2 - Labrunee, M.

A2 - Ecoffet, R.

PB - IEEE

CY - Piscataway, NJ

T2 - 3. European conference on radiation and its effects on components and systems

Y2 - 1 January 1995

ER -