Modeling of magnetic stripe domains by Fourier methods: Phase shift and phase-contrast images

Marco Beleggia, P. F. Fazzini, G. Pozzi

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 15th International Congress on Electron Microscopy
Number of pages2
Volume1
Publication date2002
Pages307-308
Publication statusPublished - 2002
Externally publishedYes
Event15th Internationcal Congress on Electron Microscopy - Durban, South Africa
Duration: 1 Sep 20026 Sep 2002
Conference number: 15

Conference

Conference15th Internationcal Congress on Electron Microscopy
Number15
CountrySouth Africa
CityDurban
Period01/09/200206/09/2002

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