Modeling of Grazing-Incidence X-ray Diffraction from Naphthyl End-Capped Oligothiophenes in Organic Field-Effect Transistors

Michael J. Winokur*, Mathias K. Huss-Hansen, Andreas E. Lauritzen, Mika Torkkeli, Jakob Kjelstrup-Hansen, Matti Knaapila

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Engineering & Materials Science

Chemical Compounds

Physics & Astronomy