Modeling microstructural evolution of multiple texture components during recrystallization

R.A. Vandermeer, D. Juul Jensen

    Research output: Contribution to journalJournal articleResearchpeer-review


    Models were formulated in an effort to characterize recrystallization in materials with multiple texture components. The models are based on a microstructural path methodology (MPM). Experimentally the microstructural evolution of conmmercial aluminum during recrystallization was characterized using stereological point and lineal measurements of microstructural properties in combination with EBSP analysis for orientation determinations. The potential of the models to describe the observed recrystallization behavior of heavily cold-rolled commercial aluminum was demonstrated. A successful MPM model was deduced which, for each texture component-random, rolling and cube orientations, was quantitatively consistent with the measured microstructural properties. Nucleation and growth rates were deduced for each texture component using the model.
    Original languageEnglish
    JournalActa Metallurgica et Materialia
    Issue number7
    Pages (from-to)2427-2436
    Publication statusPublished - 1994


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