Mobility and Carrier Concentration Measurements on nm-Wide Semiconductor Fins

M.-L. Witthøft, S. Folkersma, J. Bogdanowicz, T. Marangoni, D. Mackenzie, A. Vohra, C. Porret, R. Loo, H. H. Henrichsen, O. Hansen, W. Vandervorst, D.H. Petersen

    Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

    114 Downloads (Pure)
    Original languageEnglish
    Publication date2018
    Publication statusPublished - 2018
    Event2018 E-MRS Spring Meeting and Exhibit - Convention Centre of Strasbourg , Strasbourg , France
    Duration: 18 Jun 201822 Jul 2018


    Conference2018 E-MRS Spring Meeting and Exhibit
    LocationConvention Centre of Strasbourg

    Cite this