Mobility and Carrier Concentration Measurements on nm-Wide Semiconductor Fins

M.-L. Witthøft, S. Folkersma, J. Bogdanowicz, T. Marangoni, D. Mackenzie, A. Vohra, C. Porret, R. Loo, H. H. Henrichsen, O. Hansen, W. Vandervorst, D.H. Petersen

    Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

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    Original languageEnglish
    Publication date2018
    Publication statusPublished - 2018
    Event2018 E-MRS Spring Meeting and Exhibit - Convention Centre of Strasbourg , Strasbourg , France
    Duration: 18 Jun 201822 Jul 2018

    Conference

    Conference2018 E-MRS Spring Meeting and Exhibit
    LocationConvention Centre of Strasbourg
    CountryFrance
    CityStrasbourg
    Period18/06/201822/07/2018

    Cite this

    Witthøft, M-L., Folkersma, S., Bogdanowicz, J., Marangoni, T., Mackenzie, D., Vohra, A., ... Petersen, D. H. (2018). Mobility and Carrier Concentration Measurements on nm-Wide Semiconductor Fins. Abstract from 2018 E-MRS Spring Meeting and Exhibit, Strasbourg , France.