MM99.09 - Characterization of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine

Niels Kofod, Hans Nørgaard Hansen, Leonardo De Chiffre

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationEuSEN Conference
    PublisherShaker Verlag
    Publication date1999
    Publication statusPublished - 1999
    EventEuSPEN Conference May-june - Bremen, Germany
    Duration: 1 Jan 1999 → …


    ConferenceEuSPEN Conference May-june
    CityBremen, Germany
    Period01/01/1999 → …

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