MM99.09 - Characterization of fine surfaces using an atomic
                force microscope mounted on a coordinate measuring machine

Niels Kofod, Hans Nørgaard Hansen, Leonardo De Chiffre

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	EuSEN Conference
Publisher	Shaker Verlag
Publication date	1999
Pages	278-281
Publication status	Published - 1999
Event	EuSPEN Conference May-june - Bremen, Germany Duration: 1 Jan 1999 → …

OpenUrl availability

@inproceedings{776b75e27d10473ba8f0dd9023d083af,

title = "MM99.09 - Characterization of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine",

author = "Niels Kofod and Hansen, {Hans N{\o}rgaard} and Chiffre, {Leonardo De}",

year = "1999",

language = "English",

pages = "278--281",

booktitle = "EuSEN Conference",

publisher = "Shaker Verlag",

note = "EuSPEN Conference May-june ; Conference date: 01-01-1999",

}

TY - GEN

T1 - MM99.09 - Characterization of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine

AU - Kofod, Niels

AU - Hansen, Hans Nørgaard

AU - Chiffre, Leonardo De

PY - 1999

Y1 - 1999

M3 - Article in proceedings

SP - 278

EP - 281

BT - EuSEN Conference

PB - Shaker Verlag

T2 - EuSPEN Conference May-june

Y2 - 1 January 1999

ER -