Missing information and data fidelity in digital microstructure acquisition

Chongbing Bao, Chuanyi Ji, Henning Friis Poulsen, Mo Li*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Measuring and modeling microstructure is crucial for establishing structure-property relations. Here the digitized format of the microstructure plays an increasingly vital role in modern material design and advanced manufacturing of functional materials. However, one basic issue facing digital acquisition of microstructures has attracted little attention, namely the loss of information in the first steps of data gathering and processing. The missing information leads to serious issues in a range of topics from reconstruction of microstructures to prediction of material properties. To bring forth and quantify these issues, we develope an analytical method and a new numerical simulation scheme using Laguerre-Voronoi tessellation and Xu-Li microstructure characterization method. We then define and quantify the missing information and its impact rigorously.

Original languageEnglish
JournalActa Materialia
Volume173
Pages (from-to)262-269
Number of pages8
ISSN1359-6454
DOIs
Publication statusPublished - 2019

Keywords

  • 3D digital microstructure
  • Microstructure
  • Missing information
  • Structure-property relation

Cite this

Bao, Chongbing ; Ji, Chuanyi ; Poulsen, Henning Friis ; Li, Mo. / Missing information and data fidelity in digital microstructure acquisition. In: Acta Materialia. 2019 ; Vol. 173. pp. 262-269.
@article{1b05788d8aa4400d84f8e079ba73b9b6,
title = "Missing information and data fidelity in digital microstructure acquisition",
abstract = "Measuring and modeling microstructure is crucial for establishing structure-property relations. Here the digitized format of the microstructure plays an increasingly vital role in modern material design and advanced manufacturing of functional materials. However, one basic issue facing digital acquisition of microstructures has attracted little attention, namely the loss of information in the first steps of data gathering and processing. The missing information leads to serious issues in a range of topics from reconstruction of microstructures to prediction of material properties. To bring forth and quantify these issues, we develope an analytical method and a new numerical simulation scheme using Laguerre-Voronoi tessellation and Xu-Li microstructure characterization method. We then define and quantify the missing information and its impact rigorously.",
keywords = "3D digital microstructure, Microstructure, Missing information, Structure-property relation",
author = "Chongbing Bao and Chuanyi Ji and Poulsen, {Henning Friis} and Mo Li",
year = "2019",
doi = "10.1016/j.actamat.2019.05.012",
language = "English",
volume = "173",
pages = "262--269",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Pergamon Press",

}

Missing information and data fidelity in digital microstructure acquisition. / Bao, Chongbing; Ji, Chuanyi; Poulsen, Henning Friis; Li, Mo.

In: Acta Materialia, Vol. 173, 2019, p. 262-269.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Missing information and data fidelity in digital microstructure acquisition

AU - Bao, Chongbing

AU - Ji, Chuanyi

AU - Poulsen, Henning Friis

AU - Li, Mo

PY - 2019

Y1 - 2019

N2 - Measuring and modeling microstructure is crucial for establishing structure-property relations. Here the digitized format of the microstructure plays an increasingly vital role in modern material design and advanced manufacturing of functional materials. However, one basic issue facing digital acquisition of microstructures has attracted little attention, namely the loss of information in the first steps of data gathering and processing. The missing information leads to serious issues in a range of topics from reconstruction of microstructures to prediction of material properties. To bring forth and quantify these issues, we develope an analytical method and a new numerical simulation scheme using Laguerre-Voronoi tessellation and Xu-Li microstructure characterization method. We then define and quantify the missing information and its impact rigorously.

AB - Measuring and modeling microstructure is crucial for establishing structure-property relations. Here the digitized format of the microstructure plays an increasingly vital role in modern material design and advanced manufacturing of functional materials. However, one basic issue facing digital acquisition of microstructures has attracted little attention, namely the loss of information in the first steps of data gathering and processing. The missing information leads to serious issues in a range of topics from reconstruction of microstructures to prediction of material properties. To bring forth and quantify these issues, we develope an analytical method and a new numerical simulation scheme using Laguerre-Voronoi tessellation and Xu-Li microstructure characterization method. We then define and quantify the missing information and its impact rigorously.

KW - 3D digital microstructure

KW - Microstructure

KW - Missing information

KW - Structure-property relation

U2 - 10.1016/j.actamat.2019.05.012

DO - 10.1016/j.actamat.2019.05.012

M3 - Journal article

VL - 173

SP - 262

EP - 269

JO - Acta Materialia

JF - Acta Materialia

SN - 1359-6454

ER -