Mid-IR upconversion imaging: theory and applications

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Upconversion imaging using a χ(2) material can conveniently be viewed as an optical filter known from Fourier optics. First part discusses the solution to Helmholtz Equation with a nonlinear source term representing the χ(2) interaction process. Assuming non-depleted interaction, an explicit solution can be found using Greens Function. In the far-field the solution is found in terms of a simple 3D Fourier integral. We will analyze a 4f-setup, with the nonlinear crystal situated in the Fourier plane, for upconversion imaging. While the results resembles the linear case known from standard imaging systems, χ(2) imaging has an additional phase match term, dictated by the dispersion and birefringence amongst the three interacting fields. Birefringent crystals can be implemented as the nonlinear medium to ensure phase matching, i.e. efficient conversion of the mid-IR signal to the visible. When interaction takes place in the fs regime, group velocity mismatch will be included. The main features of the theory is presented, including applications.
Original languageEnglish
Title of host publicationProceedings of SPIE
Number of pages6
PublisherSPIE - International Society for Optical Engineering
Publication date2020
Article number112641A
ISBN (Print)9781510632912
Publication statusPublished - 2020
EventSPIE Photonics West LASE 2020
- The Moscone Center, San Francisco, United States
Duration: 1 Feb 20206 Feb 2020


ConferenceSPIE Photonics West LASE 2020
LocationThe Moscone Center
CountryUnited States
CitySan Francisco
SeriesProceedings of S P I E - International Society for Optical Engineering


  • Upconversion imaging
  • Mid-IR imaging
  • Nonlinear phase matching
  • Sum frequency generation

Cite this

Pedersen, C., Ashik, A. S., & Tidemand-Lichtenberg, P. (2020). Mid-IR upconversion imaging: theory and applications. In Proceedings of SPIE (Vol. 11264). [112641A] SPIE - International Society for Optical Engineering. Proceedings of S P I E - International Society for Optical Engineering, Vol.. 11264 https://doi.org/10.1117/12.2548283