Microwave testing of high-Tc based direct current to a single flux quantum converter

V. K. Kaplunenko, Gerd Michael Fischer, Z. G. Ivanov, Niels Falsig Pedersen, T. Claeson, Jesper Mygind, E. Wikborg

Research output: Contribution to journalJournal articleResearchpeer-review

252 Downloads (Pure)

Abstract

Design, simulation, and experimental investigations of a direct current to a single flux quantum converter loaded with a Josephson transmission line and driven by an external 70 GHz microwave oscillator are reported. The test circuit includes nine YBaCuO Josephson junctions aligned on the grain boundary of a 0°–32° asymmetric Y-ZrO2 bicrystal substrate. The performance of such converters is important for the development of the fast Josephson samplers required for testing of high-Tc rapid single flux quantum circuits in high-speed digital superconducting electronics. Journal of Applied Physics is copyrighted by The American Institute of Physics.
Original languageEnglish
JournalJournal of Applied Physics
Volume76
Issue number10
Pages (from-to)5996-6000
ISSN0021-8979
DOIs
Publication statusPublished - 1994

Bibliographical note

Copyright (1994) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Cite this

Kaplunenko, V. K., Fischer, G. M., Ivanov, Z. G., Pedersen, N. F., Claeson, T., Mygind, J., & Wikborg, E. (1994). Microwave testing of high-Tc based direct current to a single flux quantum converter. Journal of Applied Physics, 76(10), 5996-6000. https://doi.org/10.1063/1.358383