Microstructural path model and strain dependence of recrystallisation in commercial aluminium

Roy Allen Vandermeer, Guilin Wu, Dorte Juul Jensen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The isothermal recrystallisation of commercial purity aluminium alloy AA1200 cold deformed to either a true strain of 2 (86.5% reduction in thickness) or 4 (98.2% reduction in thickness) was studied phenomenologically in each material by means of quantitative microscopy. The microstructural path descriptors, V-V, the volume fraction recrystallised, and S-V, the interfacial area density separating recrystallised grains from deformed grains were measured stereologically by electron backscatter diffraction and microstructural path model parameters were deduced for each strain. The effects of strain were delineated and compared with the results of recrystallisation in a slightly different commercial aluminium alloy AA1050 deformed to a true strain of 2.3.
    Original languageEnglish
    JournalMaterials Science and Technology
    Volume25
    Issue number3
    Pages (from-to)403-406
    ISSN0267-0836
    DOIs
    Publication statusPublished - 2009

    Keywords

    • Microstructural path model
    • Materials characterization and modelling
    • Materials research
    • Strain effects
    • Aluminium
    • Recrystallisation

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