Microstructural characterization of Ni-YSZ composites by low-voltage scanning electron microscopy in FE-SEM

Yi-Lin Liu, Karl Tor Sune Thydén, Jørgen Bilde-Sørensen

Research output: Contribution to conference › Paper › Research

Original language	English
Publication date	2007
Publication status	Published - 2007
Event	8th Multinational congress on microscopy - Prague, Czech Republic Duration: 17 Jun 2007 → 21 Jun 2007

Conference	8th Multinational congress on microscopy
Country/Territory	Czech Republic
City	Prague
Period	17/06/2007 → 21/06/2007

OpenUrl availability

@conference{9c2da5528c704f76ad3e4ef9ab00ae0d,

title = "Microstructural characterization of Ni-YSZ composites by low-voltage scanning electron microscopy in FE-SEM",

keywords = "Energiteknologier p{\aa} vej",

author = "Yi-Lin Liu and Thyd{\'e}n, \{Karl Tor Sune\} and J{\o}rgen Bilde-S{\o}rensen",

year = "2007",

language = "English",

note = "8th Multinational congress on microscopy ; Conference date: 17-06-2007 Through 21-06-2007",

}