Microstructural characterization of Ni-YSZ composites by low-voltage scanning electron microscopy in FE-SEM

Yi-Lin Liu, Karl Tor Sune Thydén, Jørgen Bilde-Sørensen

    Research output: Contribution to conferencePaperResearch

    Original languageEnglish
    Publication date2007
    Publication statusPublished - 2007
    Event8. Multinational congress on microscopy - Prague, Czech Republic
    Duration: 17 Jun 200721 Jun 2007

    Conference

    Conference8. Multinational congress on microscopy
    CountryCzech Republic
    CityPrague
    Period17/06/200721/06/2007

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