Micro-four-point probes in a UHV scanning electron microscopefor in-situ surface-conductivity measurements

I. Shiraki, T. Nagao, S. Hasegawa, Christian Leth Petersen, Peter Bøggild, Torben Mikael Hansen, Francois Grey

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalSurface Review and Letters
    Volume7
    Issue number5
    Publication statusPublished - 2000

    Cite this

    Shiraki, I., Nagao, T., Hasegawa, S., Petersen, C. L., Bøggild, P., Hansen, T. M., & Grey, F. (2000). Micro-four-point probes in a UHV scanning electron microscopefor in-situ surface-conductivity measurements. Surface Review and Letters, 7(5).