Micro-four-point probes in a UHV scanning electron microscopefor in-situ surface-conductivity measurements

I. Shiraki, T. Nagao, S. Hasegawa, Christian Leth Petersen, Peter Bøggild, Torben Mikael Hansen, Francois Grey

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalSurface Review and Letters
    Volume7
    Issue number5
    Publication statusPublished - 2000

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