Micro-four-point-probe characterization of nanowires fabricated using the nanostencil technique

Rong Lin, M. Bammerlin, Ole Hansen, R.R. Schlittler, Peter Bøggild

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalNanotechnology
    Volume15
    Issue number9
    Pages (from-to)1363-1367
    ISSN0957-4484
    Publication statusPublished - 2004

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