Micro Four-point Probe: a Novel Tool for Measuring the Conductivity of Surfaces at the Micron Scale.

Peter Bøggild, Torben Mikael Hansen, C.L. Petersen, Francois Grey, T. Hassenkam, T. Bjørnholm, I. Shiraki, S. Hasegawa

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationMicro Four-point Probe: a Novel Tool for Measuring the Conductivity of Surfaces at the Micron Scale.
    PublisherJapan Society for Precision Engineering
    Publication date1999
    Pages832-836
    Publication statusPublished - 1999
    EventProc.of the 9th ICPE, Precision Science and Technology for Perfect Surfaces -
    Duration: 1 Jan 1999 → …

    Conference

    ConferenceProc.of the 9th ICPE, Precision Science and Technology for Perfect Surfaces
    Period01/01/1999 → …

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