## Abstract

The present invention proposes methods, devices and computer program products. To this extent, there is defined a set X including N distinct parameter values x_i for at least one input parameter x, N being an integer greater than or equal to 1, first measured the physical quantity Pm1 for each of the N distinct parameter values x_i of the at least one input parameter x, while keeping all other input parameters fixed, constructed a Vandermonde matrix VM using the set of N parameter values x_i of the at least one input parameter x, and computed the model W for emulating the physical quantity P based on the Vandermonde matrix and the first measured physical quantity according to the equation W=(VMT*VM)-1*VMT*Pm1. The model is iteratively refined so as to obtained a desired emulation precision.; The model can later be used to emulate the physical quantity based on input parameters or logs taken from the field and thereby support device design optimization.

Original language | English |
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IPC | G06F7/60 |

Patent number | US8712742 |

Filing date | 29/04/2014 |

Country | United States |

Priority date | 05/07/2011 |

Priority number | US201113176288 |

Publication status | Published - 29 Apr 2014 |