Method of refractive indices determination on the films interfaces based on reflectances envelopes

The presentation shows the new method allowing determination of refractive indices at interfaces of dielectric films. The method is basing on the analysis of envelopes of reflectance spectra. In the presentation there are shown theoretical foundations of simple mathematical formulas, describing refractive index values at film interfaces as well as experimental results that postively verified our method. In the first step, values of the refractive index at films interfaces were determined using our method. In the second step, reflectance spectra were calculated using the values of refractive indices obtained in the first step and compared with measured ones.