Method of refractive indices determination on the films interfaces based on reflectances envelopes

Paweł Karasiński, Cuma Tyszkiewicz, Marcin Skolik, Tomasz Błaszczyk

    Research output: Contribution to journalJournal articlepeer-review

    Abstract

    The presentation shows the new method allowing determination of refractive indices at interfaces of dielectric films. The method is basing on the analysis of envelopes of reflectance spectra. In the presentation there are shown theoretical foundations of simple mathematical formulas, describing refractive index values at film interfaces as well as experimental results that postively verified our method. In the first step, values of the refractive index at films interfaces were determined using our method. In the second step, reflectance spectra were calculated using the values of refractive indices obtained in the first step and compared with measured ones.

    Original languagePolish
    JournalPrzeglad Elektrotechniczny
    Volume94
    Issue number8
    Pages (from-to)51-54
    ISSN0033-2097
    DOIs
    Publication statusPublished - 2018

    Keywords

    • Spectrophotometry
    • Refractive index
    • Dielectric film
    • Thin film
    • Reflectance spectra

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