Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements

L. Gevaux; K. Morvan; A. Dupiau; D. Saha; Jeppe Revall Frisvad; G. Obein

doi:10.25039/x50.2023.PP008

Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements

L. Gevaux ^*, K. Morvan, A. Dupiau, D. Saha, Jeppe Revall Frisvad, G. Obein

^*Corresponding author for this work

Laboratoire Commun de Métrologie–LNE-Cnam

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

The traceability of instruments measuring reflectance on very small areas (submillimetre scale) cannot be established using conventional diffuse reflectance standards, because their measurement at very small scales is impacted by translucency and surface roughness. To establish the traceability of the bidirectional reflectance distribution function (BRDF) from the micrometric scale to the centimetric scale, we propose to use samples that have invariant reflectance properties at several scales. These samples are flat and matte samples with a regular grid of dots that are small relative to the beam multiscale size and that present a structure that limits the issues linked to translucency.

Original language	English
Title of host publication	Proceedings of the 30th Quadrennial Session of the CIE
Number of pages	10
Publisher	CIE Commision Internationale de L'eclairage
Publication date	2023
DOIs	https://doi.org/10.25039/x50.2023.PP008
Publication status	Published - 2023
Event	30^th Quadrennial Session of the CIE: Innovative Lighting Technologies - Ljubljana, Slovenia Duration: 15 Sept 2023 → 23 Sept 2023 https://cie.co.at/news/cie-2023-30th-quadrennial-session-cie

Conference

Conference	30^th Quadrennial Session of the CIE
Country/Territory	Slovenia
City	Ljubljana
Period	15/09/2023 → 23/09/2023
Internet address	https://cie.co.at/news/cie-2023-30th-quadrennial-session-cie

Keywords

BRDF
Multiscale
Measurement
Material appearance
Instrumentation

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10.25039/x50.2023.PP008

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Cite this

@inproceedings{a885486faac64a588c5379e9ee1f59cf,

title = "Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements",

abstract = "The traceability of instruments measuring reflectance on very small areas (submillimetre scale) cannot be established using conventional diffuse reflectance standards, because their measurement at very small scales is impacted by translucency and surface roughness. To establish the traceability of the bidirectional reflectance distribution function (BRDF) from the micrometric scale to the centimetric scale, we propose to use samples that have invariant reflectance properties at several scales. These samples are flat and matte samples with a regular grid of dots that are small relative to the beam multiscale size and that present a structure that limits the issues linked to translucency.",

keywords = "BRDF, Multiscale, Measurement, Material appearance, Instrumentation",

author = "L. Gevaux and K. Morvan and A. Dupiau and D. Saha and Frisvad, {Jeppe Revall} and G. Obein",

year = "2023",

doi = "10.25039/x50.2023.PP008",

language = "English",

booktitle = "Proceedings of the 30th Quadrennial Session of the CIE",

publisher = "CIE Commision Internationale de L'eclairage ",

note = "30<sup>th</sup> Quadrennial Session of the CIE : Innovative Lighting Technologies, CIE 2023 ; Conference date: 15-09-2023 Through 23-09-2023",

url = "https://cie.co.at/news/cie-2023-30th-quadrennial-session-cie",

}

Gevaux , L, Morvan, K, Dupiau, A, Saha, D, Frisvad, JR & Obein, G 2023, Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements. in Proceedings of the 30th Quadrennial Session of the CIE. CIE Commision Internationale de L'eclairage , 30^th Quadrennial Session of the CIE, Ljubljana, Slovenia, 15/09/2023. https://doi.org/10.25039/x50.2023.PP008

TY - GEN

T1 - Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements

AU - Gevaux , L.

AU - Morvan, K.

AU - Dupiau, A.

AU - Saha, D.

AU - Frisvad, Jeppe Revall

AU - Obein, G.

PY - 2023

Y1 - 2023

N2 - The traceability of instruments measuring reflectance on very small areas (submillimetre scale) cannot be established using conventional diffuse reflectance standards, because their measurement at very small scales is impacted by translucency and surface roughness. To establish the traceability of the bidirectional reflectance distribution function (BRDF) from the micrometric scale to the centimetric scale, we propose to use samples that have invariant reflectance properties at several scales. These samples are flat and matte samples with a regular grid of dots that are small relative to the beam multiscale size and that present a structure that limits the issues linked to translucency.

AB - The traceability of instruments measuring reflectance on very small areas (submillimetre scale) cannot be established using conventional diffuse reflectance standards, because their measurement at very small scales is impacted by translucency and surface roughness. To establish the traceability of the bidirectional reflectance distribution function (BRDF) from the micrometric scale to the centimetric scale, we propose to use samples that have invariant reflectance properties at several scales. These samples are flat and matte samples with a regular grid of dots that are small relative to the beam multiscale size and that present a structure that limits the issues linked to translucency.

KW - BRDF

KW - Multiscale

KW - Measurement

KW - Material appearance

KW - Instrumentation

U2 - 10.25039/x50.2023.PP008

DO - 10.25039/x50.2023.PP008

M3 - Article in proceedings

BT - Proceedings of the 30th Quadrennial Session of the CIE

PB - CIE Commision Internationale de L'eclairage

T2 - 30<sup>th</sup> Quadrennial Session of the CIE

Y2 - 15 September 2023 through 23 September 2023

ER -

Method for Traceability of Multiscale Bidirectional Reflectance Distribution Function Measurements

Abstract

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Keywords

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