Method for system-independent material characterization from spectral X-ray CT

Matteo Busi*, K. Aditya Mohan, Alex A. Dooraghi, Kyle M. Champley, Harry E. Martz, Ulrik L. Olsen

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Engineering & Materials Science

Physics & Astronomy

Chemical Compounds