Method for system-independent material characterization from spectral X-ray CT

Matteo Busi*, K. Aditya Mohan, Alex A. Dooraghi, Kyle M. Champley, Harry E. Martz, Ulrik L. Olsen

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We propose a method for material characterization using Spectral X-ray Computed Tomography (SCT). Our SCT method takes advantage of recently-developed MultiX ME 100 photon counting detectors to simultaneously measure the energy dependence of a material's linear attenuation coefficient (LAC). Relative electron density (ρe) and effective atomic number (Ze) are estimated directly from the energy-dependent LAC measurements. The method employs a spectral correction algorithm and automated selection and weighting of the energy bins for optimized performance. When examining materials with Ze ≤ 23, this method achieves accuracy comparable to traditional dual-energy CT, which is often realized through consecutive data acquisitions, and is compatible with any spectral detector. The method disregards data in photon starved energy channels improving the detection of highly attenuating materials, compared to techniques that use energy integrating detectors.

Original languageEnglish
Article number102136
JournalNDT&E international
Volume107
Number of pages6
ISSN0963-8695
DOIs
Publication statusPublished - 2019

Keywords

  • Effective atomic number
  • Electron density
  • Photon counting detectors
  • Quantitative X-ray characterization
  • Security screening
  • spectral X-ray CT

Cite this

Busi, Matteo ; Mohan, K. Aditya ; Dooraghi, Alex A. ; Champley, Kyle M. ; Martz, Harry E. ; Olsen, Ulrik L. / Method for system-independent material characterization from spectral X-ray CT. In: NDT&E international. 2019 ; Vol. 107.
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title = "Method for system-independent material characterization from spectral X-ray CT",
abstract = "We propose a method for material characterization using Spectral X-ray Computed Tomography (SCT). Our SCT method takes advantage of recently-developed MultiX ME 100 photon counting detectors to simultaneously measure the energy dependence of a material's linear attenuation coefficient (LAC). Relative electron density (ρe) and effective atomic number (Ze) are estimated directly from the energy-dependent LAC measurements. The method employs a spectral correction algorithm and automated selection and weighting of the energy bins for optimized performance. When examining materials with Ze ≤ 23, this method achieves accuracy comparable to traditional dual-energy CT, which is often realized through consecutive data acquisitions, and is compatible with any spectral detector. The method disregards data in photon starved energy channels improving the detection of highly attenuating materials, compared to techniques that use energy integrating detectors.",
keywords = "Effective atomic number, Electron density, Photon counting detectors, Quantitative X-ray characterization, Security screening, spectral X-ray CT",
author = "Matteo Busi and Mohan, {K. Aditya} and Dooraghi, {Alex A.} and Champley, {Kyle M.} and Martz, {Harry E.} and Olsen, {Ulrik L.}",
year = "2019",
doi = "10.1016/j.ndteint.2019.102136",
language = "English",
volume = "107",
journal = "NDT&E international",
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Method for system-independent material characterization from spectral X-ray CT. / Busi, Matteo; Mohan, K. Aditya; Dooraghi, Alex A.; Champley, Kyle M.; Martz, Harry E.; Olsen, Ulrik L.

In: NDT&E international, Vol. 107, 102136, 2019.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Method for system-independent material characterization from spectral X-ray CT

AU - Busi, Matteo

AU - Mohan, K. Aditya

AU - Dooraghi, Alex A.

AU - Champley, Kyle M.

AU - Martz, Harry E.

AU - Olsen, Ulrik L.

PY - 2019

Y1 - 2019

N2 - We propose a method for material characterization using Spectral X-ray Computed Tomography (SCT). Our SCT method takes advantage of recently-developed MultiX ME 100 photon counting detectors to simultaneously measure the energy dependence of a material's linear attenuation coefficient (LAC). Relative electron density (ρe) and effective atomic number (Ze) are estimated directly from the energy-dependent LAC measurements. The method employs a spectral correction algorithm and automated selection and weighting of the energy bins for optimized performance. When examining materials with Ze ≤ 23, this method achieves accuracy comparable to traditional dual-energy CT, which is often realized through consecutive data acquisitions, and is compatible with any spectral detector. The method disregards data in photon starved energy channels improving the detection of highly attenuating materials, compared to techniques that use energy integrating detectors.

AB - We propose a method for material characterization using Spectral X-ray Computed Tomography (SCT). Our SCT method takes advantage of recently-developed MultiX ME 100 photon counting detectors to simultaneously measure the energy dependence of a material's linear attenuation coefficient (LAC). Relative electron density (ρe) and effective atomic number (Ze) are estimated directly from the energy-dependent LAC measurements. The method employs a spectral correction algorithm and automated selection and weighting of the energy bins for optimized performance. When examining materials with Ze ≤ 23, this method achieves accuracy comparable to traditional dual-energy CT, which is often realized through consecutive data acquisitions, and is compatible with any spectral detector. The method disregards data in photon starved energy channels improving the detection of highly attenuating materials, compared to techniques that use energy integrating detectors.

KW - Effective atomic number

KW - Electron density

KW - Photon counting detectors

KW - Quantitative X-ray characterization

KW - Security screening

KW - spectral X-ray CT

U2 - 10.1016/j.ndteint.2019.102136

DO - 10.1016/j.ndteint.2019.102136

M3 - Journal article

AN - SCOPUS:85070317316

VL - 107

JO - NDT&E international

JF - NDT&E international

SN - 0963-8695

M1 - 102136

ER -