Method for Measuring Small Nonlinearities of Electric Characteristics

Tom Guldbrandsen; Niels I Meyer; Jørgen Schjær-Jacobsen

doi:10.1063/1.1719690

Method for Measuring Small Nonlinearities of Electric Characteristics

Tom Guldbrandsen, Niels I Meyer, Jørgen Schjær-Jacobsen

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Abstract

A method is described for measuring very small deviations from linearity in electric characteristics. The measurement is based on the harmonics generated by the nonlinear element when subjected to a sine wave signal. A special bridge circuit is used to balance out the undesired harmonics of the signal generator together with the first harmonic frequency. The set-up measures the small-signal value and the first and second derivative with respect to voltage. The detailed circuits are given for measuring nonlinearities in Ohmic and capacitive components. In the Ohmic case, a sensitivity in the measurement of the relative second order nonlinearity of about 5×10−8 is obtained. In the capacitive case, the sensitivity expressed in terms of the minimum measurable values of the derivatives is dC/dV = 1.5×10−17 F/V and d2C/dV2 = 2×10−16 F/V2. ©1965 The American Institute of Physics

Original language	English
Journal	Review of Scientific Instruments
Volume	36
Issue number	6
Pages (from-to)	743-746
ISSN	0034-6748
DOIs	https://doi.org/10.1063/1.1719690
Publication status	Published - 1965

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Copyright (1965) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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title = "Method for Measuring Small Nonlinearities of Electric Characteristics",

abstract = "A method is described for measuring very small deviations from linearity in electric characteristics. The measurement is based on the harmonics generated by the nonlinear element when subjected to a sine wave signal. A special bridge circuit is used to balance out the undesired harmonics of the signal generator together with the first harmonic frequency. The set-up measures the small-signal value and the first and second derivative with respect to voltage. The detailed circuits are given for measuring nonlinearities in Ohmic and capacitive components. In the Ohmic case, a sensitivity in the measurement of the relative second order nonlinearity of about 5×10−8 is obtained. In the capacitive case, the sensitivity expressed in terms of the minimum measurable values of the derivatives is dC/dV = 1.5×10−17 F/V and d2C/dV2 = 2×10−16 F/V2. {\textcopyright}1965 The American Institute of Physics",

author = "Tom Guldbrandsen and Meyer, {Niels I} and J{\o}rgen Schj{\ae}r-Jacobsen",

note = "Copyright (1965) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.",

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T1 - Method for Measuring Small Nonlinearities of Electric Characteristics

AU - Guldbrandsen, Tom

AU - Meyer, Niels I

AU - Schjær-Jacobsen, Jørgen

N1 - Copyright (1965) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

PY - 1965

Y1 - 1965

N2 - A method is described for measuring very small deviations from linearity in electric characteristics. The measurement is based on the harmonics generated by the nonlinear element when subjected to a sine wave signal. A special bridge circuit is used to balance out the undesired harmonics of the signal generator together with the first harmonic frequency. The set-up measures the small-signal value and the first and second derivative with respect to voltage. The detailed circuits are given for measuring nonlinearities in Ohmic and capacitive components. In the Ohmic case, a sensitivity in the measurement of the relative second order nonlinearity of about 5×10−8 is obtained. In the capacitive case, the sensitivity expressed in terms of the minimum measurable values of the derivatives is dC/dV = 1.5×10−17 F/V and d2C/dV2 = 2×10−16 F/V2. ©1965 The American Institute of Physics

AB - A method is described for measuring very small deviations from linearity in electric characteristics. The measurement is based on the harmonics generated by the nonlinear element when subjected to a sine wave signal. A special bridge circuit is used to balance out the undesired harmonics of the signal generator together with the first harmonic frequency. The set-up measures the small-signal value and the first and second derivative with respect to voltage. The detailed circuits are given for measuring nonlinearities in Ohmic and capacitive components. In the Ohmic case, a sensitivity in the measurement of the relative second order nonlinearity of about 5×10−8 is obtained. In the capacitive case, the sensitivity expressed in terms of the minimum measurable values of the derivatives is dC/dV = 1.5×10−17 F/V and d2C/dV2 = 2×10−16 F/V2. ©1965 The American Institute of Physics

U2 - 10.1063/1.1719690

DO - 10.1063/1.1719690

M3 - Journal article

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JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 6

ER -

Method for Measuring Small Nonlinearities of Electric Characteristics

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