The present disclosure relates to a method for characterization of a solar cell, comprising the steps of: providing an optical probe light; modulating the optical probe light with a modulation frequency of between 100 kHz and 50 MHz, thereby obtaining a modulated probe light; scanning the modulated probe light such that said modulated probe light is incident on at least a part of the surface of the solar cell, and such that the part of the solar cell exposed to the modulated probe light converts the modulated probe light to an electrical signal; detecting and analyzing said electrical signal; and estimating variations in the solar cell, thereby electrically characterizing the solar cell. The disclosure further relates to a solar cell characterization apparatus for characterization of a solar cell, comprising: a light source for generating an optical probe light; a modulation unit, configured to produce modulated probe light by modulating the optical probe light with a modulation frequency of between 100 kHz and 0 MHz; a light scanning unit for scanning the modulated probe light such that said modulated probe light is incident on at least a part of the surface of the solar cell; and a 1 signal analyzer, configured to detect and analyze electrical signals produced by the solar cell as a response to exposure of the modulated probe light.
|IPC||H02S 50/ 15 A I|
|Country/Territory||International Bureau of the World Intellectual Property Organization (WIPO)|
|Publication status||Published - 16 Mar 2017|