Abstract
By Three Dimensional X-ray Diffraction (3DXRD) microscopy it is possible to characterize microstructures non-destructively in 3 dimensions. The measurements are furthermore typically so fast that dynamics may be monitored in-situ, giving also the 4'th dimension, namely the time. The 3DXRD technique is based on diffraction of high energy x-rays from third generation synchrotron sources. In the present paper the 3DXRD technique is described and it's potentials are illustrated by examples relating to elastic and plastic strains, recovery, recrystallization and grain growth.
Original language | English |
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Title of host publication | Proceedings of ASME International Mechanical Engineering Congress and Exposition |
Number of pages | 7 |
Publisher | The American Society of Mechanical Engineers (ASME) |
Publication date | 2004 |
Pages | 27-33 |
Article number | IMECE2004-62435 |
ISBN (Electronic) | 0-7918-4724-1 |
DOIs | |
Publication status | Published - 2004 |
Event | ASME 2004 International Mechanical Engineering Congress and Exposition - Anaheim, United States Duration: 13 Nov 2004 → 19 Nov 2004 |
Conference
Conference | ASME 2004 International Mechanical Engineering Congress and Exposition |
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Country/Territory | United States |
City | Anaheim |
Period | 13/11/2004 → 19/11/2004 |