Metal Microstructures in Four Dimensions

S. F. Nielsen, C. Gundlach, E. M. Lauridsen, R. V. Martins, H. F. Poulsen, S. Schmidt, D. Juul Jensen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    By Three Dimensional X-ray Diffraction (3DXRD) microscopy it is possible to characterize microstructures non-destructively in 3 dimensions. The measurements are furthermore typically so fast that dynamics may be monitored in-situ, giving also the 4'th dimension, namely the time. The 3DXRD technique is based on diffraction of high energy x-rays from third generation synchrotron sources. In the present paper the 3DXRD technique is described and it's potentials are illustrated by examples relating to elastic and plastic strains, recovery, recrystallization and grain growth.
    Original languageEnglish
    Title of host publicationProceedings of ASME International Mechanical Engineering Congress and Exposition
    Number of pages7
    PublisherAmerican Society of Mechanical Engineers
    Publication date2004
    Pages27-33
    Article numberIMECE2004-62435
    ISBN (Electronic)0-7918-4724-1
    DOIs
    Publication statusPublished - 2004
    EventASME 2004 International Mechanical Engineering Congress and Exposition - Anaheim, United States
    Duration: 13 Nov 200419 Nov 2004

    Conference

    ConferenceASME 2004 International Mechanical Engineering Congress and Exposition
    CountryUnited States
    CityAnaheim
    Period13/11/200419/11/2004

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