Megahertz measurement rate wavemeter with sub-picometer resolution using second harmonic generation

Mathias Christensen, Anders Kragh Hansen, Danny Noordegraaf, Peter M. W. Skovgaard, Ole Bjarlin Jensen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

Information on the wavelength is essential for most laser applications and a wide range of devices are available for measuring it. Commercially available wavemeters can provide femtometer resolution in a wide wavelength range but their refresh rate rarely goes into the kHz range. Streak cameras, on the other hand, provide extremely fast measurements with a wide spectrum. However, the spectral resolution is severely limited due to the use of a grating as the wavelength separating element. Here we present a wavemeter that combines a megahertz measurement rate and sub-picometer wavelength resolution. The technique uses the steep wavelength acceptance curve of a thick non-linear crystal to calculate the wavelength from just two power measurements. The bandwidth is limited only by the speed of a photodiode while the resolution and wavelength range can be engineered by choosing a suitable crystal type and geometry. We use the wavemeter to examine how the longitudinal mode evolves during a single pulse from a tapered diode laser. High resolution, high speed measurements of the wavelength can give new information about laser diodes, which is valuable for applications requiring short but wavelength stable pulses, such as pulsing of the second harmonic light.
Original languageEnglish
Title of host publicationProceedings of SPIE
Number of pages7
Volume10517
PublisherSPIE - International Society for Optical Engineering
Publication date2018
Article number105170H
DOIs
Publication statusPublished - 2018
EventSPIE Photonics West LASE 2018: Real-time Measurements, Rogue Phenomena, and Single-Shot Applications III - San Francisco, United States
Duration: 27 Jan 20181 Feb 2018

Conference

ConferenceSPIE Photonics West LASE 2018
CountryUnited States
CitySan Francisco
Period27/01/201801/02/2018
SeriesProceedings of S P I E - International Society for Optical Engineering
Volume105170
ISSN0277-786X

Keywords

  • Laser beam characterization
  • Diode lasers
  • Harmonic generation and mixing

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