Mechanisms of Electron Beam-Induced Damage in ZIF-8 MOF and its Implications for In-Situ TEM Studies

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Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Original language	English
Publication date	2025
Number of pages	1
Publication status	Published - 2025
Event	Microscopy Conference 2025 - Karlsruhe, Germany Duration: 31 Aug 2025 → 4 Sept 2025

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@conference{745bbb13233a4fbb898893f7315973b3,

title = "Mechanisms of Electron Beam-Induced Damage in ZIF-8 MOF and its Implications for In-Situ TEM Studies",

author = "Pritam Banerjee and Kollmannsberger, \{Kathrin L.\} and Fischer, \{Roland A.\} and Joerg Jinschek",

year = "2025",

language = "English",

note = "Microscopy Conference 2025, MC 2025 ; Conference date: 31-08-2025 Through 04-09-2025",

}

Mechanisms of Electron Beam-Induced Damage in ZIF-8 MOF and its Implications for In-Situ TEM Studies. / Banerjee, Pritam; Kollmannsberger, Kathrin L.; Fischer, Roland A. et al.
2025. Abstract from Microscopy Conference 2025, Karlsruhe, Baden-Württemberg, Germany.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review