Measuring voltage transients with an ultrafast scanning tunneling microscope

Ulrich Dieter Felix Keil; Jacob Riis Jensen; Jørn Märcher Hvam

doi:10.1063/1.118938

Measuring voltage transients with an ultrafast scanning tunneling microscope

Ulrich Dieter Felix Keil
, Jacob Riis Jensen
, Jørn Märcher Hvam

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Abstract

We use an ultrafast scanning tunneling microscope to resolve propagating voltage transients in space and time. We demonstrate that the previously observed dependence of the transient signal amplitude on the tunneling resistance was only caused by the electrical sampling circuit. With a modified circuit, where the tunneling tip is directly connected to the current amplifier of the scanning tunneling microscope, this dependence is eliminated. Ail results can be explained with coupling through the geometrical capacitance of the tip-electrode junction. By illuminating the current-gating photoconductive switch with a rigidly attached fiber, the probe is scanned without changing the probe characteristics. (C) 1997 American Institute of Physics.

Original language	English
Journal	Applied Physics Letters
Volume	70
Issue number	19
Pages (from-to)	2625-2627
ISSN	0003-6951
DOIs	https://doi.org/10.1063/1.118938
Publication status	Published - 1997

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Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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PROBE

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AB - We use an ultrafast scanning tunneling microscope to resolve propagating voltage transients in space and time. We demonstrate that the previously observed dependence of the transient signal amplitude on the tunneling resistance was only caused by the electrical sampling circuit. With a modified circuit, where the tunneling tip is directly connected to the current amplifier of the scanning tunneling microscope, this dependence is eliminated. Ail results can be explained with coupling through the geometrical capacitance of the tip-electrode junction. By illuminating the current-gating photoconductive switch with a rigidly attached fiber, the probe is scanned without changing the probe characteristics. (C) 1997 American Institute of Physics.

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Measuring voltage transients with an ultrafast scanning tunneling microscope

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