Measuring voltage transients with an ultrafast scanning tunneling microscope

Ulrich Dieter Felix Keil, Jacob Riis Jensen, Jørn Märcher Hvam

    Research output: Contribution to journalJournal articleResearchpeer-review

    463 Downloads (Pure)

    Abstract

    We use an ultrafast scanning tunneling microscope to resolve propagating voltage transients in space and time. We demonstrate that the previously observed dependence of the transient signal amplitude on the tunneling resistance was only caused by the electrical sampling circuit. With a modified circuit, where the tunneling tip is directly connected to the current amplifier of the scanning tunneling microscope, this dependence is eliminated. Ail results can be explained with coupling through the geometrical capacitance of the tip-electrode junction. By illuminating the current-gating photoconductive switch with a rigidly attached fiber, the probe is scanned without changing the probe characteristics. (C) 1997 American Institute of Physics.
    Original languageEnglish
    JournalApplied Physics Letters
    Volume70
    Issue number19
    Pages (from-to)2625-2627
    ISSN0003-6951
    DOIs
    Publication statusPublished - 1997

    Bibliographical note

    Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

    Keywords

    • PROBE

    Fingerprint

    Dive into the research topics of 'Measuring voltage transients with an ultrafast scanning tunneling microscope'. Together they form a unique fingerprint.

    Cite this