We present a detailed discussion of a recently demonstrated experimental technique capable of measuring the orrelation function of a pulsed light source with picosecond time resolution. The measurement involves a streak camera in single photon counting mode, which is modified such that a signal at a fixed repetition rate, and well defined energy, can be monitored after each pulsed laser excitation. The technique provides further insight into the quantum optical properties of pulsed light emission from semiconductor nanostructures, and the dynamics inside a pulse, on the subnanosecond time scale.
Bibliographical noteThis paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-18-19-20229. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Assmann, M., Veit, F., Tempel, J-S., Berstermann, T., Stolz, H., Poel, M. V. D., Hvam, J. M., & Bayer, M. (2010). Measuring the dynamics of second-order photon correlation functions inside a pulse with picosecond time resolution. Optics Express, 18(19), 20229-20241. https://doi.org/10.1364/OE.18.020229