Measuring residual stresses of individual grains in polycrystalline materials using 3DXRD

Jette Oddershede, Søren Schmidt, Henning Friis Poulsen, Walter Reimers

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	2009
Publication status	Published - 2009
Event	International Conference on Processing and Manufacturing of Advanced Materials - Berlin (DE), 25-29 Aug. Duration: 1 Jan 2009 → …

Conference	International Conference on Processing and Manufacturing of Advanced Materials
City	Berlin (DE), 25-29 Aug.
Period	01/01/2009 → …

Keywords

@conference{dea4cd070723491d83ee5a1f48063694,

title = "Measuring residual stresses of individual grains in polycrystalline materials using 3DXRD",

keywords = "Materials characterization and modelling, Materials research, Materialeforskning, Materialekarakterisering og materialemodellering",

author = "Jette Oddershede and S{\o}ren Schmidt and Poulsen, {Henning Friis} and Walter Reimers",

year = "2009",

language = "English",

note = "International Conference on Processing and Manufacturing of Advanced Materials, THERMEC ; Conference date: 01-01-2009",

}

Measuring residual stresses of individual grains in polycrystalline materials using 3DXRD. / Oddershede, Jette; Schmidt, Søren; Poulsen, Henning Friis et al.
2009. Abstract from International Conference on Processing and Manufacturing of Advanced Materials, Berlin (DE), 25-29 Aug..

Research output: Contribution to conference › Conference abstract for conference › Research

TY - ABST

T1 - Measuring residual stresses of individual grains in polycrystalline materials using 3DXRD

AU - Oddershede, Jette

AU - Schmidt, Søren

AU - Poulsen, Henning Friis

AU - Reimers, Walter

PY - 2009

Y1 - 2009

KW - Materials characterization and modelling

KW - Materials research

KW - Materialeforskning

KW - Materialekarakterisering og materialemodellering

M3 - Conference abstract for conference

T2 - International Conference on Processing and Manufacturing of Advanced Materials

Y2 - 1 January 2009

ER -