Measurements of X-ray relectivities of Au-coatings at several energies

Allan Hornstrup, Finn Erland Christensen, J. Garnaes, E. Jespersen, Z. Shou-Hua, H.W. Schnopper, Gregory M. Sanger, Paul B. Reid, Lionel R. Baker

Research output: Contribution to journalJournal articleResearchpeer-review


We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Pages (from-to)257-268
Publication statusPublished - 1990


  • Gold and Alloys--Coatings
  • Optical Variables Measurement
  • Telescopes
  • X-Rays--Reflection
  • Optical Coatings
  • A
  • T
  • X

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