We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.
|Journal||Proceedings of SPIE, the International Society for Optical Engineering|
|Publication status||Published - 1990|
- Gold and Alloys--Coatings
- Optical Variables Measurement
- Optical Coatings
Hornstrup, A., Christensen, F. E., Garnaes, J., Jespersen, E., Shou-Hua, Z., Schnopper, H. W., Sanger, G. M., Reid, P. B., & Baker, L. R. (1990). Measurements of X-ray relectivities of Au-coatings at several energies. Proceedings of SPIE, the International Society for Optical Engineering, 1333, 257-268. https://doi.org/10.1117/12.22811