Measurements of X-ray relectivities of Au-coatings at several energies

Allan Hornstrup; Finn Erland Christensen; J. Garnaes; E. Jespersen; Z. Shou-Hua; H.W. Schnopper; Gregory M. Sanger; Paul B. Reid; Lionel R. Baker

doi:10.1117/12.22811

Measurements of X-ray relectivities of Au-coatings at several energies

Allan Hornstrup, Finn Erland Christensen, J. Garnaes, E. Jespersen, Z. Shou-Hua, H.W. Schnopper, Gregory M. Sanger, Paul B. Reid, Lionel R. Baker

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.

Original language	English
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1333
Pages (from-to)	257-268
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.22811
Publication status	Published - 1990

Keywords

Gold and Alloys--Coatings
Optical Variables Measurement
Telescopes
X-Rays--Reflection
Optical Coatings
A
T
X

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@article{134457e062ce4768a5f4a74f2d86b510,

title = "Measurements of X-ray relectivities of Au-coatings at several energies",

abstract = "We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.",

keywords = "Gold and Alloys--Coatings, Optical Variables Measurement, Telescopes, X-Rays--Reflection, Optical Coatings, A, T, X",

author = "Allan Hornstrup and Christensen, {Finn Erland} and J. Garnaes and E. Jespersen and Z. Shou-Hua and H.W. Schnopper and Sanger, {Gregory M.} and Reid, {Paul B.} and Baker, {Lionel R.}",

year = "1990",

doi = "10.1117/12.22811",

language = "English",

volume = "1333",

pages = "257--268",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "Society of Photo-Optical Instrumentation Engineers",

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TY - JOUR

T1 - Measurements of X-ray relectivities of Au-coatings at several energies

AU - Hornstrup, Allan

AU - Christensen, Finn Erland

AU - Garnaes, J.

AU - Jespersen, E.

AU - Shou-Hua, Z.

AU - Schnopper, H.W.

AU - Sanger, Gregory M.

AU - Reid, Paul B.

AU - Baker, Lionel R.

PY - 1990

Y1 - 1990

N2 - We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.

AB - We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.

KW - Gold and Alloys--Coatings

KW - Optical Variables Measurement

KW - Telescopes

KW - X-Rays--Reflection

KW - Optical Coatings

KW - A

KW - T

KW - X

U2 - 10.1117/12.22811

DO - 10.1117/12.22811

M3 - Journal article

SN - 0277-786X

VL - 1333

SP - 257

EP - 268

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

ER -

Measurements of X-ray relectivities of Au-coatings at several energies

Abstract

Keywords

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