Measurements of functional response of nano-objects using advanced electron microscopy

Y. Zhu, T. Beetz, L. Wu, R. Klie, L. Huang, J. W. Lau, M. A. Schofield, V. V. Volkov, Marco Beleggia, M. Malac

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume12
Issue numberSupplement S02
Pages (from-to)540-541
Number of pages2
ISSN1431-9276
DOIs
Publication statusPublished - 2006
Externally publishedYes
EventMicroscopy and Microanalysis 2006 - Chicago, IL, United States
Duration: 30 Jul 20053 Aug 2005

Conference

ConferenceMicroscopy and Microanalysis 2006
CountryUnited States
CityChicago, IL
Period30/07/200503/08/2005

Cite this

Zhu, Y., Beetz, T., Wu, L., Klie, R., Huang, L., Lau, J. W., Schofield, M. A., Volkov, V. V., Beleggia, M., & Malac, M. (2006). Measurements of functional response of nano-objects using advanced electron microscopy. Microscopy and Microanalysis, 12(Supplement S02), 540-541. https://doi.org/10.1017/S143192760606925X