Measurements of beam skirt profiles under various conditions in low vacuum SEMs

Jørgen Bilde-Sørensen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationProceedings book
    EditorsS. Jørgensen, A.E. Gunnæs
    Place of Publications.l.
    PublisherScandinavian Society for Electron Microscopy
    Publication date2003
    Pages47-48
    Publication statusPublished - 2003
    EventSCANDEM 2003. 54. Annual meeting of the Scandinavian Society for Electron Microscopy - Oslo (NO), 10-13 Jun
    Duration: 1 Jan 2003 → …

    Conference

    ConferenceSCANDEM 2003. 54. Annual meeting of the Scandinavian Society for Electron Microscopy
    CityOslo (NO), 10-13 Jun
    Period01/01/2003 → …

    Cite this

    Bilde-Sørensen, J. (2003). Measurements of beam skirt profiles under various conditions in low vacuum SEMs. In S. Jørgensen, & A. E. Gunnæs (Eds.), Proceedings book (pp. 47-48). Scandinavian Society for Electron Microscopy.