Measurement of the Charge Distribution Along an Electrically Biased Carbon Nanotube Using Electron Holography

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	16
Issue number	Supplement S2
Pages (from-to)	562-563
Number of pages	2
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927610056138
Publication status	Published - 2010
Event	Microscopy and Microanalysis 2010 - Portland, OR, United States Duration: 1 Aug 2010 → 5 Aug 2010 http://www.microscopy.org/mandm/2010/index.cfm

Conference	Microscopy and Microanalysis 2010
Country/Territory	United States
City	Portland, OR
Period	01/08/2010 → 05/08/2010
Internet address	http://www.microscopy.org/mandm/2010/index.cfm

Access to Document

@inproceedings{79a5c5bb555b4846a4e383cdf9b10e85,

title = "Measurement of the Charge Distribution Along an Electrically Biased Carbon Nanotube Using Electron Holography",

author = "Marco Beleggia and Takeshi Kasama and Dunin-Borkowski, \{Rafal E.\} and G. Pozzi",

year = "2010",

doi = "10.1017/S1431927610056138",

language = "English",

volume = "16",

pages = "562--563",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "Supplement S2",

note = "Microscopy and Microanalysis 2010, M\&M 2010 ; Conference date: 01-08-2010 Through 05-08-2010",

url = "http://www.microscopy.org/mandm/2010/index.cfm",

}

TY - GEN

T1 - Measurement of the Charge Distribution Along an Electrically Biased Carbon Nanotube Using Electron Holography

AU - Beleggia, Marco

AU - Kasama, Takeshi

AU - Dunin-Borkowski, Rafal E.

AU - Pozzi, G.

PY - 2010

Y1 - 2010

U2 - 10.1017/S1431927610056138

DO - 10.1017/S1431927610056138

M3 - Conference article

SN - 1431-9276

VL - 16

SP - 562

EP - 563

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement S2

T2 - Microscopy and Microanalysis 2010

Y2 - 1 August 2010 through 5 August 2010

ER -