Measurement of surface temperature and emissivity by a multitemperature method for Fourier-transform infrared spectrometers

Surface temperatures are estimated with high precision based on a multitemperature method for Fourier-transform spectrometers. The method is based on Planck's radiation law and a nonlinear least-squares fitting algorithm applied to two or more spectra at different sample temperatures and a single measurement at a known sample temperature, for example, at ambient temperature. The temperature of the sample surface can be measured rather easily at ambient temperature. The spectrum at ambient temperature is used to eliminate background effects from spectra as measured at other surface temperatures. The temperatures of the sample are found in a single calculation from the measured spectra independently of the response function of the instrument and the emissivity of the sample. The spectral emissivity of a sample can be measured if the instrument is calibrated against a blackbody source. Temperatures of blackbody sources are estimated with an uncertainty of 0.2-2 K. The method is demonstrated for measuring the spectral emissivity of a brass specimen and an oxidized nickel specimen. (C) 1996 Optical Society of America