Measurement of small dispersion values in optical components

Christophe Peucheret; Fenghai Liu; Rune Johan Skullerud Pedersen

Measurement of small dispersion values in optical components

Christophe Peucheret, Fenghai Liu, Rune Johan Skullerud Pedersen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.

Original language	English
Journal	Electronics Letters
Volume	35
Issue number	5
Pages (from-to)	409-411
ISSN	0013-5194
Publication status	Published - 1999

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title = "Measurement of small dispersion values in optical components",

abstract = "It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.",

author = "Christophe Peucheret and Fenghai Liu and Pedersen, {Rune Johan Skullerud}",

year = "1999",

language = "English",

volume = "35",

pages = "409--411",

journal = "Electronics Letters",

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TY - JOUR

T1 - Measurement of small dispersion values in optical components

AU - Peucheret, Christophe

AU - Liu, Fenghai

AU - Pedersen, Rune Johan Skullerud

PY - 1999

Y1 - 1999

N2 - It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.

AB - It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.

M3 - Journal article

SN - 0013-5194

VL - 35

SP - 409

EP - 411

JO - Electronics Letters

JF - Electronics Letters

IS - 5

ER -