Measurement of small dispersion values in optical components

Christophe Peucheret, Fenghai Liu, Rune Johan Skullerud Pedersen

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.
Original languageEnglish
JournalElectronics Letters
Volume35
Issue number5
Pages (from-to)409-411
ISSN0013-5194
Publication statusPublished - 1999

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