Measurement of Self-coherence in the Transmission Electron Microscope for Detecting Time-dependent Coherent-inelastic Electron Scattering in the Heisenberg Limit

Christian Kisielowski; Peta  Specht; Joerg R. Jinschek; Stig Helveg

doi:10.1093/mam/ozaf048.1134

Measurement of Self-coherence in the Transmission Electron Microscope for Detecting Time-dependent Coherent-inelastic Electron Scattering in the Heisenberg Limit

Christian Kisielowski
, Peta Specht
, Joerg R. Jinschek
, Stig Helveg^*

^*Corresponding author for this work

Electron Scattering Solutions
University of California at Berkeley

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	31
Issue number	7
Pages (from-to)	2306-2308
ISSN	1431-9276
DOIs	https://doi.org/10.1093/mam/ozaf048.1134
Publication status	Published - 2025

Bibliographical note

For poster presentation

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10.1093/mam/ozaf048.1134

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Cite this

@article{ab248d36b97e44d8853dd9676f7269cc,

title = "Measurement of Self-coherence in the Transmission Electron Microscope for Detecting Time-dependent Coherent-inelastic Electron Scattering in the Heisenberg Limit",

author = "Christian Kisielowski and Peta Specht and Jinschek, \{Joerg R.\} and Stig Helveg",

note = "For poster presentation ",

year = "2025",

doi = "10.1093/mam/ozaf048.1134",

language = "English",

volume = "31",

pages = "2306--2308",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "7",

}

Measurement of Self-coherence in the Transmission Electron Microscope for Detecting Time-dependent Coherent-inelastic Electron Scattering in the Heisenberg Limit. / Kisielowski, Christian; Specht, Peta ; Jinschek, Joerg R. et al.
In: Microscopy and Microanalysis, Vol. 31, No. 7, 2025, p. 2306-2308.

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

TY - ABST

T1 - Measurement of Self-coherence in the Transmission Electron Microscope for Detecting Time-dependent Coherent-inelastic Electron Scattering in the Heisenberg Limit

AU - Kisielowski, Christian

AU - Specht, Peta

AU - Jinschek, Joerg R.

AU - Helveg, Stig

N1 - For poster presentation

PY - 2025

Y1 - 2025

U2 - 10.1093/mam/ozaf048.1134

DO - 10.1093/mam/ozaf048.1134

M3 - Conference abstract in journal

SN - 1431-9276

VL - 31

SP - 2306

EP - 2308

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 7

ER -