This paper presents measurements of specular and non-specular reflectivities of a W/Si multilayer with period d=135.1 A. Angular dispersive measurements were performed at 8.05 keY and 59.3 keY, while energy dispersive measurements were made in the range of 17 keV to 130 keY. At an incidence angle of 1.57 mrad the fourth order Bragg-reflection is found at an energy of 120 keY with a reflectivity in excess of 50 % and a bandwidth (FWHM) of 3 %.
|Journal||Proceedings of SPIE, the International Society for Optical Engineering|
|Publication status||Published - 1993|
|Event||Multilayer and Grazing Incidence X-Ray/EUV Optics II - San Diego, CA, United States|
Duration: 14 Jul 1993 → 16 Jul 1993
|Conference||Multilayer and Grazing Incidence X-Ray/EUV Optics II|
|City||San Diego, CA|
|Period||14/07/1993 → 16/07/1993|
Hoeghoej, P., Joensen, K. D., Christensen, F. E., & Susini, J. (1993). Measurement of multilayer reflectivities from 8 keV to 130 keV. Proceedings of SPIE, the International Society for Optical Engineering, (2011), 354-359.