Measurement of Internal Stresses by Neutron Diffraction Using a Position-Sensitive Detector

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Residual Stresses in Science and Technology
Editors	E. Macherauch, V. Hauk
Place of Publication	Oberusel
Publisher	DGM Informationsgesellschaft
Publication date	1987
Pages	143-150
ISBN (Print)	3-88355-099-X
Publication status	Published - 1987

OpenUrl availability

@inproceedings{240d06b4601d41e6b26c0d23a7a50abe,

title = "Measurement of Internal Stresses by Neutron Diffraction Using a Position-Sensitive Detector",

author = "T. Leffers and T. Lorentzen and \{Juul Jensen\}, D. and J{\o}rgen Kjems",

year = "1987",

language = "English",

isbn = "3-88355-099-X",

pages = "143--150",

editor = "E. Macherauch and V. Hauk",

booktitle = "Residual Stresses in Science and Technology",

publisher = "DGM Informationsgesellschaft",

}

Measurement of Internal Stresses by Neutron Diffraction Using a Position-Sensitive Detector. / Leffers, T.; Lorentzen, T.; Juul Jensen, D. et al.
Residual Stresses in Science and Technology. ed. / E. Macherauch; V. Hauk. Oberusel: DGM Informationsgesellschaft, 1987. p. 143-150.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - Measurement of Internal Stresses by Neutron Diffraction Using a Position-Sensitive Detector

AU - Leffers, T.

AU - Lorentzen, T.

AU - Juul Jensen, D.

AU - Kjems, Jørgen

PY - 1987

Y1 - 1987

M3 - Article in proceedings

SN - 3-88355-099-X

SP - 143

EP - 150

BT - Residual Stresses in Science and Technology

A2 - Macherauch, E.

A2 - Hauk, V.

PB - DGM Informationsgesellschaft

CY - Oberusel

ER -